By Topic

Fault Diagnosis Based on Effect-Cause Analysis: An Introduction

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$33 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

2 Author(s)
M. Abramovici ; Bell Telephone Laboratories, Naperville, Illinois ; M. A. Breuer

This paper presents the basic concepts of a new fault diagnosis technique which has the following features: 1) is applicable to both single and multiple faults, 2) does not require fault enumeration, 3) can identify faults which prevent initialization, 4) can indicate the presence of nonstuck faults in the D.U.T., 5) can identify fault-free lines in the D.U.T. Our technique, referred to as effect-cause analysis, does not require a fault dictionary and it is not based on comparing the obtained response of the D.U.T. with the expected response, which is not assumed to be known. Effect-cause analysis directly processes the actual response of the D.U.T. to the applied test (the effect) to determine the possible fault situations (the causes) which can generate that response.

Published in:

Design Automation, 1980. 17th Conference on

Date of Conference:

23-25 June 1980