Cart (Loading....) | Create Account
Close category search window

Selective-mapping type peak power reduction techniques for turbo coded OFDM

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

3 Author(s)
Mao-Chao Lin ; Dept. of Electr. Eng., Nat. Taiwan Univ., Taipei, Taiwan ; Yung-Chih Tsai ; Chung-Jay Yang

In an earlier paper, a selective-mapping type turbo coded OFDM scheme was proposed, for which the interleaver of the encoder of the turbo coding can be varied to reduce the associated PAPR (peak to average power ratio) while the transmission of side information is not needed. In this paper, we propose two modified versions of that scheme. For the first, the variation of the interleaver of the turbo encoder is replaced by the variation of the bit permutation of the turbo codeword. For the second, the variation of the interleaver of the turbo encoder is replaced by the variation of a maximum-length sequence which is added to the turbo codeword. These two modified schemes can provide better PAPR reduction capability.

Published in:

Wireless Networks, Communications and Mobile Computing, 2005 International Conference on  (Volume:1 )

Date of Conference:

13-16 June 2005

Need Help?

IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.