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Radiation hardness evaluation of a class V 32-bit floating-point digital signal processor

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4 Author(s)
Joshi, R. ; Texas Instruments Inc., Dallas, TX, USA ; Daniels, R. ; Shoga, M. ; Gauthier, M.

The single event effects (SEE) and total ionizing dose (TID) test results of SMV320C6701, a 32-bit, floating-point digital signal processor (DSP) from Texas Instruments (TI) are reported in this paper. The DSP was tested for SEE using heavy ions and high energy neutrons. Effects characterized include single event upsets (SEU) and single event latch-up (SEL). Additional effects such as functional interrupts and transients are also discussed. Finally, the proton SEU rates extrapolated from the heavy ion SEU rates are presented.

Published in:

Radiation Effects Data Workshop, 2005. IEEE

Date of Conference:

11-15 July 2005