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Dynamic single event upset characterization of the Virtex-IIPro's embedded IBM PowerPC405 using proton irradiation

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3 Author(s)
Chayab, F. ; MDA Corp., Brampton, Ont., Canada ; Hiemstra, D.M. ; Ronge, R.

The proton induced dynamic SEU cross-section of the IBM PowerPC405 embedded in Xilinx's Virtex-IIPro FPGAs is reported. This upset cross-section is then used to estimate upset rates in the space radiation environment.

Published in:

Radiation Effects Data Workshop, 2005. IEEE

Date of Conference:

11-15 July 2005

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