Referenced Items are not available for this document.
An accurate physical model of switched-capacitor ΔΣ analog-to-digital converters (ADCs) noise is presented. Noise artifacts for various ADC blocks are captured using simple equations. Model is verified against measured 0.25-μm high dynamic range ADC test chip for a wireless receiver. Design guidelines based on the proposed model are discussed.
Published in:
Circuits and Systems I: Regular Papers, IEEE Transactions on
(Volume:52
,
Issue:
11
)
Date of Publication: Nov. 2005
- Page(s):
- 2319 - 2326
- ISSN :
- 1549-8328
- INSPEC Accession Number:
- 8650011
- Digital Object Identifier :
- 10.1109/TCSI.2005.853948
- Product Type:
- Journals & Magazines
- Date of Current Version :
- 07 November 2005
- Issue Date :
- Nov. 2005
- Sponsored by :
- IEEE Circuits and Systems Society
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