Close category search window
 

Generalized ISAR - part I: an optimal method for imaging large naval vessels

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

2 Author(s)
Given, J.A. ; Naval Res. Lab., Washington, DC, USA ; Schmidt, W.R.

We describe a generalized inverse synthetic aperture radar (ISAR) process that performs well under a wide variety of conditions common to the naval ISAR tests of large vessels. In particular, the generalized ISAR process performs well in the presence of moderate intensity ship roll. The process maps localized scatterers onto peaks on the ISAR plot. However, in a generalized ISAR plot, each of the two coordinates of a peak is a fixed linear combination of the three ship coordinates of the scatterer causing the peak. Combining this process with interferometry will then provide high-accuracy three-dimensional location of the important scatterers on a ship. We show that ISAR can be performed in the presence of simultaneous roll and aspect change, provided the two Doppler rates are not too close in magnitude. We derive the equations needed for generalized ISAR, both roll driven and aspect driven, and test them against simulations performed in a variety of conditions, including large roll amplitudes.

Published in:
Image Processing, IEEE Transactions on  (Volume:14 ,  Issue: 11 )

Date of Publication: Nov. 2005

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2013 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.