IEEE.org| IEEE Xplore Digital Library| IEEE Standards| IEEE Spectrum| More Sites

Cart (Loading....) | Create Account | 

Close category search window
Author Searchbeta |  Advanced Search  |  Preferences |  Search Tips  |  More Search Options  
 
Browse Conference Publications > Intelligent Vehicles Symposiu ... Help

Edge extraction method study based on maximum entropy for linear lane identifying and tracking

Full Text Sign-In or Purchase

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing! close button
puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

5 Author(s)
Wang Rong-ben ; Transp. Coll., Jilin Univ., Changchun, China ; Yu Tian-hong ; Jin Li-sheng ; Chu Jiang-wei
more authors

In order to better abstract lane mark edge and identify it, this paper proposes a new edge extraction method based on maximum entropy. This method combines both one-dimension and two-dimension entropy information. Meanwhile, image window variation technology is also applied for lane mark edge extraction and lane mark parameters can be acquired based on the bi-normalized adjustable template. Finally lane mark real-time tracking is realized by applying trapezia AOI method.

Published in:
Intelligent Vehicles Symposium, 2005. Proceedings. IEEE

Date of Conference: 6-8 June 2005

Page(s):
849 - 854
Print ISBN:
0-7803-8961-1
INSPEC Accession Number:
8643056
Digital Object Identifier :
10.1109/IVS.2005.1505211

IEEE Account

Purchase Details

Profile Information

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2013 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.