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Determine two-port S-parameters from one-port measurements using calibration substrate standards

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2 Author(s)
J. Ou ; Dept. of Electr. & Comput. Eng., Rutgers Univ., Piscataway, NJ, USA ; M. F. Caggiano

A technique for determining two port S-parameters from one port measurements using calibration substrate standards is described in this paper. Closed form formulas are derived to facilitate conversion from one port reflection measurements to two-port S-parameters. Comparisons are made to previously reported techniques. It is observed that the two-port S-parameters generated using SOL method is free of artificial ripples typically observed in two port S-parameters generated by the SO and the cascade methods.

Published in:

Proceedings Electronic Components and Technology, 2005. ECTC '05.

Date of Conference:

31 May-3 June 2005