By Topic

A probabilistic approach to evaluate the reliability of piezoelectric micro-actuators

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$33 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

3 Author(s)
Zhimin He ; Data Storage Inst., Singapore, Singapore ; Han Tong Loh ; Eng Hong Ong

In this paper, a probabilistic design approach is presented to evaluate the reliability of piezoelectric micro actuators. Based on the relationship between the lifetime, and degradation mechanism of piezoelectric actuators, and the electric field strength, the concept of "electric strength" is proposed to indicate the electric field strength of the piezoelectric actuators at a specified lifetime. The lifetime (number of cycles to failure) of the piezoelectric actuator, electric strength, and electric load are considered as the random variables; and their probability distributions are discussed. The interference model of electric load, and electric strength is introduced to the reliability design of piezoelectric micro actuators. By this approach, the relationship between the reliability, and the lifetime of the piezoelectric actuator can be given. A case study of the disk drive head positioning system demonstrates the application of the approach.

Published in:

Reliability, IEEE Transactions on  (Volume:54 ,  Issue: 1 )