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Code-width testing-based compact ADC BIST circuit

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5 Author(s)
Dongmyung Lee ; Electr. & Electron. Eng. Dept., Univ. of Yonsei, Seoul, South Korea ; Kwisung Yoo ; Kicheol Kim ; Gunhee Han
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This paper proposes a new analog-to-digital converter (ADC) built-in self-test (BIST) scheme based on code-width and sample-difference testing that does not require a slope-calibrated ramp signal. The proposed BIST scheme can be implemented by a simple digital circuit whose gate count is only approximately 550. The proposed BIST scheme is verified by simulation with 138 test circuits of 6-b pipeline ADC with arbitrary faults. Simulation results show that it effectively detects not only the catastrophic faults but also some parametric faults. The simulated fault coverage is approximately 99%.

Published in:

Circuits and Systems II: Express Briefs, IEEE Transactions on  (Volume:51 ,  Issue: 11 )

Date of Publication:

Nov. 2004

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