Cart (Loading....) | Create Account
Close category search window
 

Simulation of Nakagami fading channels with arbitrary cross-correlation and fading parameters

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

3 Author(s)
Keli Zhang ; Sch. of Electr. & Electron. Eng., Nanyang Technol. Univ., Singapore, Singapore ; Zhefeng Song ; Yong Liang Guan

Nakagami fading model is widely used in modeling wireless communication systems. In this paper, we present methods to generate Nakagami fading signals with arbitrary cross-correlation and fading parameters by taking the square root of correlated Gamma random variables (RVs) with the corresponding shape parameters. To generate correlated Gamma RVs with different noninteger values of m-parameters, two methods, namely the decomposition method and Sim's method, are proposed. The former is more flexible and efficient. The latter is mathematically exact but carries constraints on the permissible simulation parameters. Simulations show that both methods produce outputs that match well with the specifications.

Published in:

Wireless Communications, IEEE Transactions on  (Volume:3 ,  Issue: 5 )

Date of Publication:

Sept. 2004

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.