Cart (Loading....) | Create Account
Close category search window
 

A joint approach to erasure marking and Viterbi decoding for impulsive noise channels

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

3 Author(s)
Tao Li ; Dept. of Electr. & Electron. Eng., Hong Kong Univ. of Sci. & Technol., Kowloon, China ; Wai Ho Mow ; Man Hung Siu

In many real-world communication systems, the extent of nonGaussian impulsive noise (IN) rather than Gaussian noise, poses practical limits on the achievable system performance. The decoding of IN-corrupted signals is complicated by the fact that accurate IN statistics are typically unavailable at the receiver. The conventional method is to mark the IN corrupted symbol as erasures before an error-and-erasure decoding is applied. In this work, we investigate a joint erasure marking Viterbi algorithm (JEVA), which allows significant error rate performance improvement over the separate erasure marking and decoding approach to be obtained at the expense of a higher complexity.

Published in:

Signal Processing Advances in Wireless Communications, 2003. SPAWC 2003. 4th IEEE Workshop on

Date of Conference:

15-18 June 2003

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.