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Manufacturing efficiency improvement through automation of test wafer procedures

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2 Author(s)
Ferland, P. ; Nat. Semicond. Corp., South Portland, ME, USA ; Labonte, A.

One of the critical challenges facing semiconductor manufacturing in today's competitive market is the need to drive profitability by increasing efficiency without increasing headcount. A traditionally manpower-intensive area of manufacturing is tool qualification test wafer management. A study is presented using a seven-step focused-improvement methodology to develop and implement Computer-Integrated Manufacturing (CIM) tools to reduce manual intervention in test wafer management for labor and error minimization.

Published in:

Advanced Semiconductor Manufacturing, 2004. ASMC '04. IEEE Conference and Workshop

Date of Conference:

4-6 May 2004

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