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Effect of perturbations in the geometry on the electroencephalography inverse problem

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3 Author(s)
N. von Ellenrieder ; Fac. de Ingenieria, Univ. Nacional de La Plata, Argentina ; C. H. Muravchik ; A. Nehorai

We study the effect of perturbations in the geometry of the head model on the accuracy of electroencephalography (EEG) source parameter estimation. These perturbations are small changes in the surfaces between layers of different electric conductivities used to model the head. We use a meshless method to solve the EEG forward problem. The method needs only a set of points on the surfaces to describe the model geometry. It allows a simple computation of the sensitivity of the estimation problem to the positions of these surface points. The effect of the perturbations on the measured electric potential is analyzed by means of the Cramer-Rao bound for the source parameter estimation.

Published in:

Statistical Signal Processing, 2003 IEEE Workshop on

Date of Conference:

28 Sept.-1 Oct. 2003