Cart (Loading....) | Create Account
Close category search window
 

Decision tree-based methodology for high impedance fault detection

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

2 Author(s)
Yong Sheng ; Electr. & Comput. Eng. Dept., Indiana Univ.-Purdue Univ. Indianapolis, IN, USA ; Rovnyak, S.M.

This paper presents a high impedance fault (HIF) detection method based on decision trees (DTs). The features of HIF, which are the inputs of DTs, are those well-known ones, including current [in root mean square (rms)], magnitudes of the second, third, and fifth harmonics, and the phase of the third harmonics. The only measurements needed in the proposed method are the current signals sampled at 1920 Hz. It will reduce the cost of hardware compared with methods that use high sampling rates. A new HIF model is also used. The data of current signals are from the simulation of Electromagnetic Transients Program (EMTP). The DT algorithm trained can successfully distinguish the HIFs from most normal operations on simulation data, including switching loads, switching shunt capacitors, and load transformer inrush currents. Testing on experimental data is recommended for future work.

Published in:

Power Delivery, IEEE Transactions on  (Volume:19 ,  Issue: 2 )

Date of Publication:

April 2004

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.