Referenced Items are not available for this document.
This paper presents ESPRIT, an automatic test pattern generation (ATPG) system for testing single stuck-at faults in combinational logic. ESPRIT generates test patterns by performing fault simulation on random patterns derived from nonuniformly distributed input signal probabilities. The system computes input signal probabilities that minimize a testability cost function. Using ESPRIT, we have observed orders-of-magnitude reduction in the number of random trials required to obtain a given fault coverage.
Published in:
Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on
(Volume:6
,
Issue:
6
)
Date of Publication: November 1987
- Page(s):
- 1082 - 1087
- ISSN :
- 0278-0070
- Digital Object Identifier :
- 10.1109/TCAD.1987.1270348
- Product Type:
- Journals & Magazines
- Date of Current Version :
- 03 March 2004
- Issue Date :
- November 1987
- Sponsored by :
- IEEE Council on Electronic Design Automation
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