Scheduled System Maintenance:
On Monday, April 27th, IEEE Xplore will undergo scheduled maintenance from 1:00 PM - 3:00 PM ET (17:00 - 19:00 UTC). No interruption in service is anticipated.
By Topic

Microtechnology, nanotechnology, and the scanning-probe microscope: an innovative course

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

3 Author(s)
Adams, J.D. ; Nevada Ventures Nanoscience Program, Univ. of Nevada, Reno, NV, USA ; Rogers, B.S. ; Leifer, L.J.

An innovative combined microtechnology/nanotechnology/scanning-probe microscope (SPM) course for undergraduate and graduate students has been developed at the University of Nevada, Reno, in conjunction with Stanford University, Stanford, CA. Two years of technical SPM research carried out at Stanford University was transferred to the classroom before the results of the research were completed and published. The course, which was mapped to the Kolb learning cycle, was well received by students and serves as an example of an effective, innovative, and highly pertinent small-systems course anchored by the SPM.

Published in:

Education, IEEE Transactions on  (Volume:47 ,  Issue: 1 )