Cart (Loading....) | Create Account
Close category search window
 

An exploratory study of component reliability using unit testing

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

4 Author(s)
Torkar, R. ; Dept. of Informatics & Math., Univ. of Trollhattan/Uddevalla, Trollhattan, Sweden ; Mankefors, S. ; Hansson, K. ; Jonsson, A.

Using basic unit testing techniques we found 25 faults in a core component within a larger component oriented framework after the component had already started to he reused. We found that, even though this particular component had been subject to subsystem and system testing and used for some time, several faults were discovered which seriously would have affected applications using it, especially in terms of reliability. This study clearly indicates the need of a new approach to testing and verification within component-based development and reuse.

Published in:

Software Reliability Engineering, 2003. ISSRE 2003. 14th International Symposium on

Date of Conference:

17-20 Nov. 2003

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.