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A method to find don't care values in test sequences for sequential circuits

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5 Author(s)
Higami, Y. ; Dept. of Comput. Sci., Ehime Univ., Matsuyama, Japan ; Kobayashi, S.Y. ; Takamatsu, Y. ; Kajihara, S.
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We propose a method to find don't care (X) values in a test sequence for a sequential circuit. Given a fully specified test sequence generated by a sequential ATPG, the proposed method produces a test sequence containing Xs without losing stuck-at fault coverage of the original test sequence.

Published in:

Computer Design, 2003. Proceedings. 21st International Conference on

Date of Conference:

13-15 Oct. 2003