A low-power high-speed chip-to-chip interface scheme is described having a density of 625pins/mm2. The interface utilizes capacitively coupled contactless minipads, return-to-half-V00 signaling and sense amplifying F/F. The measured test chip fabricated in 0.35μm CMOS delivers up to 1.27Gb/s/pin at 3mW/pin.
Published in:
Solid-State Circuits Conference, 2003. Digest of Technical Papers. ISSCC. 2003 IEEE International
Date of Conference: 2003