IEEE.org| IEEE Xplore Digital Library| IEEE Standards| IEEE Spectrum| More Sites

Cart (Loading....) | Create Account | 

Close category search window
Author Searchbeta |  Advanced Search  |  Preferences |  Search Tips  |  More Search Options  
 
Browse Journals & Magazines > Instrumentation and Measureme ...> Volume:52 Issue:4 Help

A precompliance EMC test-set based on a sampling oscilloscope

Full Text Sign-In or Purchase

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing! close button
puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

3 Author(s)
Parvis, M. ; Dipt. di Elettronica, Politecnico di Torino, Italy ; Perrone, G. ; Vallan, A.

In this paper, a precompliance test-set for the measurement of conducted emissions based on a medium-level sampling oscilloscope and on a fast filtering algorithm (DFT) is presented. This system has been designed as a low-cost alternative to the typical precompliance test-sets that are based on spectrum analyzers equipped with EMC filters and peak detectors. Experimental examples of the results obtained using a sampling oscilloscope with 8 Kbytes of memory are given.

Published in:
Instrumentation and Measurement, IEEE Transactions on  (Volume:52 ,  Issue: 4 )

Date of Publication: Aug. 2003

Page(s):
1220 - 1223
ISSN :
0018-9456
INSPEC Accession Number:
7745318
Digital Object Identifier :
10.1109/TIM.2003.816839
Product Type:
Journals & Magazines
Date of Current Version :
23 September 2003
Issue Date :
Aug. 2003
Sponsored by :
IEEE Instrumentation and Measurement Society

IEEE Account

Purchase Details

Profile Information

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2013 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.