By Topic

The measurement of the tip current noise as a method to characterize the exposed area of coated ESTM tips

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

4 Author(s)
Abadal, G. ; Departament d''Enginyeria Electronica, Univ. Autonoma de Barcelona, Spain ; Perez-Murano, F. ; Barniol, N. ; Aymerich, X.

A new method to characterize the uncoated area of electrochemical scanning tunneling microscopy (ESTM) tips based on the measurement of the rms tip current noise is presented. A clear relationship between this noise and the exposed area measured by means of different standard techniques is shown. A simple model based on the tip-electrolyte system allows adjustment of the relationship. The new technique is advantageous with respect to the standard methods because it is nondestructive and because it can be applied in situ during an ESTM experiment, allowing continuous monitoring of the tip coating state.

Published in:

Instrumentation and Measurement, IEEE Transactions on  (Volume:52 ,  Issue: 3 )