Cart (Loading....) | Create Account
Close category search window

High resolution spectral estimates obtained using data extrapolation

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

1 Author(s)
Griffiths, L. ; University of Colorado, Boulder, Colorado

Two different methods for extrapolating a given time-limited data sequence have been proposed. The first uses a linear prediction model and the second is based on a bandlimited constraint. In both cases, the extrapolated sequence is constrained to equal the initial data on the given interval and to provide an estimate of the data outside that interval. A high resolution spectral estimate which contains both gain and phase information is then computed from a Fourier Transform of the extrapolated sequence. This paper develops a closed-form expressions for these spectral estimators when the estimates are constrained to be discrete. In this case, relatively simple expressions result which can be used to compare the two methods in a straightforward manner.

Published in:

Acoustics, Speech, and Signal Processing, IEEE International Conference on ICASSP '80.  (Volume:5 )

Date of Conference:

Apr 1980

Need Help?

IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.