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Defect distribution for wearable system design

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2 Author(s)
Dorsey, J.G. ; Dept. of Electr. & Comput. Eng., Carnegie Mellon Univ., Pittsburgh, PA, USA ; Siewiorek, D.P.

This paper describes a design process for custom wearable systems produced in an academic setting. A set of 245 wearable design defects from two distinct periods separated by six years in time is presented. These data identify aspects of the process requiring significant developer effort, which we show using an orthogonal defect classification scheme. A comparison of defect attribute distributions across the two separate design periods is given. The results show that growing electronic complexity is increasing the number of defects caused by designer error, and that more defects are being observed in earlier phases of the design process.

Published in:

Wearable Computers, 2002. (ISWC 2002). Proceedings. Sixth International Symposium on

Date of Conference:

2002