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On-chip circuits providing automatic, remote, and complete monitoring of all interconnects exterior to the die will be covered in this report. Proper monitor/logic sensitivity ratio assures detection of incipient faults and simplifies device testing, monitoring of on-chip functionality and final fault isolation.
Solid-State Circuits Conference. Digest of Technical Papers. 1978 IEEE International (Volume:XXI )
Date of Conference: 15-17 Feb. 1978