Referenced Items are not available for this document.
On-chip circuits providing automatic, remote, and complete monitoring of all interconnects exterior to the die will be covered in this report. Proper monitor/logic sensitivity ratio assures detection of incipient faults and simplifies device testing, monitoring of on-chip functionality and final fault isolation.
Published in:
Solid-State Circuits Conference. Digest of Technical Papers. 1978 IEEE International
(Volume:XXI
)
Date of Conference: 15-17 Feb. 1978
- Page(s):
- 218 - 219
- Conference Location :
- San Francisco, CA, USA
- Digital Object Identifier :
- 10.1109/ISSCC.1978.1155838
- Product Type:
- Conference Publications
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