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Why is less information from logic simulation more useful in fault simulation?

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4 Author(s)
S. B. Akers ; Massachusetts Univ., Amherst, MA, USA ; S. Park ; B. Krishnamurthy ; A. Swaminathan

The authors propose a novel linear-time algorithm for identifying, in a large combinatorial circuit, a large set of faults that are undetectable by a given test vector. Although this so-called X-algorithm does not identify all the undetectable faults, empirical evidence is offered to show that the reduction in the number of remaining faults to be simulated is significant. The algorithm is intended as a simple, fast preprocessing step to be performed after a test vector has been generated, but before the (often lengthy) process of fault simulation begins. The empirical results indicate that the X-algorithm is both useful (indicated by the utility factor) and good (indicated by the effectiveness factor). It provides as much as a 50% reduction in the number of faults that need to be simulated. Moreover, the algorithm seems to identify a large fraction of the undetectable faults

Published in:

Test Conference, 1990. Proceedings., International

Date of Conference:

10-14 Sep 1990