Referenced Items are not available for this document.
Methods of measuring the self-resonant frequency of capacitors are presented. Precautions and faults of the various techniques are discussed. The difficulty of measuring the self-resonant frequency (SRF) of a capacitor is greater than might be suspected. Of the several plausible techniques, none is without deficiencies.
Published in:
Components, Hybrids, and Manufacturing Technology, IEEE Transactions on
(Volume:5
,
Issue:
4
)
Date of Publication: Dec 1982
- Page(s):
- 528 - 530
- ISSN :
- 0148-6411
- Digital Object Identifier :
- 10.1109/TCHMT.1982.1135992
- Product Type:
- Journals & Magazines
- Date of Current Version :
- 06 January 2003
- Issue Date :
- Dec 1982
- Sponsored by :
- IEEE Components, Packaging, and Manufacturing Technology Society
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