Referenced Items are not available for this document.
Two instruments for viewing small structures are reviewed. The theory, construction, and microfabrication of the scanning tunneling microscope and the atomic force microscope are discussed. Some results are included
Date of Conference: 11-14 Feb 1990
- Page(s):
- 188 - 191
- Meeting Date :
- 11 Feb 1990-14 Feb 1990
- INSPEC Accession Number:
- 3764185
- Conference Location :
- Napa Valley, CA
- Digital Object Identifier :
- 10.1109/MEMSYS.1990.110274
- Product Type:
- Conference Publications
About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies
A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2013 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.
