By Topic

Squeeze-film damping in solid-state accelerometers

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

1 Author(s)
Starr, J.B. ; Honeywell Inc., Plymouth, MN, USA

Criteria are set forth that are aimed at altering the designer to the onset of nonlinear and compressible effects in accelerometers. A finite-element technique is presented that essentially solves Reynold's equation for small displacements and squeeze numbers by analogy with heat conduction in a solid with internal heat generation. Examples are presented that show film pressure profiles generated for complex geometries with nonuniform film thicknesses and squeeze velocities. A technique for mitigation of compressibility effects through film pressurization is suggested. Ideal damping results if both the squeeze number and the relative displacement are kept much less than 1.0. If these conditions are satisfied, one can then use finite-element techniques to estimate damping coefficients for other than simple geometries.<>

Published in:

Solid-State Sensor and Actuator Workshop, 1990. 4th Technical Digest., IEEE

Date of Conference:

4-7 June 1990