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Synchronization reliability in CMOS technology

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1 Author(s)

The synchronization performance of CMOS circuits is examined theoretically and experimentally. Criteria for maximizing CMOS gain are determined and are then compared with NMOS gain curves. The phase characteristics of metastability are identified. Experimental measurements of error rate are made on a CMOS test circuit, and the gain-bandwidth product for the circuit is determined from these data.

Published in:

IEEE Journal of Solid-State Circuits  (Volume:20 ,  Issue: 4 )