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Behavior of analog MOS integrated circuits at high temperatures

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4 Author(s)

Thermal effects on small-signal characteristics of MOS transistors are studied and parameters of MOS amplifiers operating at high temperatures are calculated. The predicted performance has been experimentally verified and high-temperature measurements of an operational amplifier and a switched-capacitor precision amplifier are presented.

Published in:

Solid-State Circuits, IEEE Journal of  (Volume:20 ,  Issue: 4 )