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Browse Journals & Magazines > Instrumentation and Measureme ...> Volume:51 Issue:4 Help

A comprehensive phase-spectrum approach to metrological characterization of hysteretic ADCs

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3 Author(s)
Monteiro, C.L. ; Dept. of Electr. & Comput. Eng., Tech. Univ. of Lisbon, Portugal ; Arpaia, P. ; Serra, A.C.

A phase-spectrum-based approach to the dynamic characterization of hysteretic analog-to-digital converters is proposed. Analytical relations between hysteresis of the dynamic transfer characteristic and out-of-phase components of the output Fourier spectrum are given. On this basis, an error model, a figure of merit, and a procedure for dynamic hysteresis testing are presented. Results of numerical characterization and experimental validation tests highlight the practical effectiveness of the proposed approach and its suitability for standardization.

Published in:
Instrumentation and Measurement, IEEE Transactions on  (Volume:51 ,  Issue: 4 )

Date of Publication: Aug 2002

Page(s):
756 - 763
ISSN :
0018-9456
INSPEC Accession Number:
7450796
Digital Object Identifier :
10.1109/TIM.2002.803303
Date of Current Version :
10 December 2002
Issue Date :
Aug 2002
Sponsored by :
IEEE Instrumentation and Measurement Society

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