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Analysis of incorporating logistic testing-effort function into software reliability modeling

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2 Author(s)
Chin-Yu Huang ; Dept. of Electr. Eng., Nat. Taiwan Univ., Taipei, Taiwan ; Sy-Yen Kuo

This paper investigates a SRGM (software reliability growth model) based on the NHPP (nonhomogeneous Poisson process) which incorporates a logistic testing-effort function. SRGM proposed in the literature consider the amount of testing-effort spent on software testing which can be depicted as an exponential curve, a Rayleigh curve, or a Weibull curve. However, it might not be appropriate to represent the consumption curve for testing-effort by one of those curves in some software development environments. Therefore, this paper shows that a logistic testing-effort function can be expressed as a software-development/test-effort curve and that it gives a good predictive capability based on real failure-data. Parameters are estimated, and experiments performed on actual test/debug data sets. Results from applications to a real data set are analyzed and compared with other existing models to show that the proposed model predicts better. In addition, an optimal software release policy for this model, based on cost-reliability criteria, is proposed

Published in:

Reliability, IEEE Transactions on  (Volume:51 ,  Issue: 3 )

Date of Publication:

Sep 2002

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