Nano Probing for Microwave Engineers: Calculating Probe-Sample Capacitance and Charge Distribution of a Near-Field Scanning Microwave Microscope on a Nanoscale

The app described in this article was presented at the student design competition of the 2016 IEEE Microwave Theory and Techniques Society (MTT-S) International Microwave Symposium. As sponsored by Technical Committee MTT-25 on RF nanotechnology, the competition's objective was to develop user-friendly interfaces to facilitate the design and application of RF nanotechnology. To this end, the app is capable of simulating the capacitance and charge distribution of the probe-sample interaction on a nanoscale in near-field scanning microscopes, such as the scanning microwave microscope (SMM), the atomic force microscope (AFM), and the scanning tunneling microscope (STM).