A new prediction-methodology on avionics embedded electronics: why? how?

Systematic embedded equipment follow-up shows a great difference between reliability prediction and the field reliability. The authors study another reliability prediction method, based on the reliability tests performed by the parts manufacturers. The proposed methodology is applied to avionics embedded electronics equipment and the results are compared to field return data. A very good accordance between these predictive reliability data and field data is shown. The limitations of this methodology are also analyzed.