Reliability Performance of a 70-GHz Mixer in 65-nm Technology

A downconversion mixer using the double-balanced Gilbert cell structure is fabricated using 65-nm CMOS technology. The mixer maximum conversion gain is -0.93 dB, IF output power at the 1-dB compression point is -4 dBm, and IIP3 is 6.12 dBm with IF at 1 GHz. In addition, mixer reliability subjected to dynamic stress at elevated VDD is examined experimentally. Transistor measurement was investigated to provide physical insight into the stress effect on device and circuit degradation.