Sensitivity Analysis of Broadband On-Wafer Dielectric Spectroscopy of Yeast Cell Suspensions up to 110 GHz

This letter presents broadband on-wafer dielectric spectroscopy of baker's yeast cell suspensions up to 110 GHz. A detailed analysis of the sensitivities to measurement repeatability and uncertainties in the multi-step de-embedding procedure is performed. The Cole-Cole dispersion parameters of the cell suspensions are obtained from measured complex permittivity data between 0.5 and 110 GHz. Our analysis shows that the measured complex permittivity per frequency is most sensitive to length uncertainties of the test fixture, while the relaxation time in the Cole-Cole model is most sensitive to measurement repeatability.