Fabrication and characterization of large area Cd0.9Zn0.1Te guarded pixelated detector

Cd
_0.9
Zn
_0.1
Te (CZT) gamma radiation detectors are presently among the best semiconductor materials for room temperature operation. CZT crystals in pixilated geometry can be efficiently used in the field of Homeland security and medical diagnosis for high resolution imaging purpose and position sensitive measurements using x-rays and high energy gamma rays. Large area CZT single crystals has been grown using a tellurium solvent method. A 10×10 guarded pixilated detector has been fabricated on a ~19.5×19.5×5 mm
³
crystal cut out from the grown ingot. A full area planar Au contact was used as the cathode. Each pixel of the pixilated detector was 1.3×1.3 mm
²
in area and pitched at 1.8 mm. A 100 μm wide guard grid was used to reduce inter-pixel leakage. The crystal was characterized in planar configuration using electrical and optoelectronic methods prior to the fabrication of pixilated geometry. Current-voltage (I-V) measurements revealed a leakage current of 29 nA at an operating bias voltage of 1100 V. A resistivity of ~3.1×10
¹⁰
Ω·cm was calculated from the I-V measurements. Infrared transmission imaging revealed an average tellurium inclusion/precipitate size less than 8μm. Pockels measurement has revealed a near-uniform depth-wise distribution of the internal electric field. The mobility-lifetime product in this crystal was calculated to be 6.2 × 10
^-3
cm
²
/V using alpha ray spectroscopic method. Gamma spectroscopy using a
¹³⁷
Cs source on the pixelated structure showed fully resolved 662 keV gamma peaks for all the pixels, with percentage resolution (FWHM) as low as 1.8 %.