Extreme Value Analysis in Flash Memories for Dosimetry Applications

A commercial off-the-shelf flash memory is repurposed for use as a dosimeter. Target theory is used to derive fitting curves, and the curves are used to derive the extreme value distribution. This extreme value distribution predicts when the first failures will occur, allowing low doses to be measured. Pre-exposing the DUT to a known dose will reduce the free charge on the floating gate. Combining both methodologies can reduce the sensitivity of the DUT to any level desired.