Abstract:
We present the applications of time-resolved spectrometer for soft X-ray (SXR) excited luminescence measurements. We use the spectrometer to monitor the delayed recombina...Show MoreMetadata
Abstract:
We present the applications of time-resolved spectrometer for soft X-ray (SXR) excited luminescence measurements. We use the spectrometer to monitor the delayed recombination phenomena in the scintillation response of ZnO:Ga nanoparticles, {\rm SrHfO}_{3} microcrystalline powder, and rare-earth doped {\rm LiCaAlF}_{6} single crystals in an extended time and dynamic range. The nanosecond soft X-ray ({\rm E}\approx 0.4\ {\rm keV}) pulse plasma source is used for excitation of a scintillation process. High sensitivity of our experiment is enabled by an intense nanosecond SXR pulse with a very short absorption length (<1\ \mu{\rm m}) in scintillation materials and sensitive fast photomultiplier-based detection. Thus, we are able to measure decay profiles with signal-to-noise ratio as high as 10^{5} and with nanosecond resolution over millisecond time range. Moreover, the presented technique allows studying powder materials, due to the aforementioned extremely short absorption length of SXR.
Published in: IEEE Transactions on Nuclear Science ( Volume: 61, Issue: 1, February 2014)