Electrical Test Structure for the Measurement of Hermeticity in Electronic and MEMS Packages With Small Cavity Volumes

The design, fabrication, and characterization of a piezoresistive membrane deflection test structure for the electrical evaluation of hermeticity in low cavity volume packages is discussed. This test structure uses the zero-level silicon cap as a deflecting membrane to electrically monitor changes in package cavity pressure over time. The hermeticity of the package can then be determined in real-time and low leak rates can be measured using a pressurization stage, which also accelerates the test. The minimum detectable leak rate of the test structure without acceleration has been measured at 6.9× 10
^-12
atm·cm
³
·s
^-1
, which is two orders of magnitude lower than the limit of a traditional helium fine leak test.