Measurements of EMI susceptibility in ultra-low-voltage OpAmps

With the increasing use of low voltage portable devices, analog circuits with low power consumption and ultra low voltage supply are needed. In this circuits the susceptibility to electromagnetic interferences has not deeply investigated. In this paper, the effects of interferences in an ultra low voltage CMOS amplifier designed to have high EMI immunity have been measured and the results have been compared to that of an ultra low voltage commercial amplifier.