EMC immunity of an integrated low side driver circuit under varying RF loads

We present EMC immunity investigations for an integrated low side driver circuit in Smart Power technology. The output (drain) voltage is monitored while it is subjected to direct power injection (DPI). DPI immunity is characterized for different load conditions. The results show that robustness significantly differs for different types of RF loads and provide a quantification. Control of the load dependence of immunity is relevant especially for IC-Pins which are connected directly to external circuitry or wiring.