Reliability enhancement via Sleep Transistors

CMOS is still the predominating technology for digital designs with no identifiable concurrence in the near future. Driving forces of this leadership are the high miniaturization capability and the reliability of CMOS. The latter, though, is decreasing with an alarming pace against the background of technologies with sizes at the nanoscale. The consequence is a rising demand of solutions to improve lifetime reliability and yield of today's integrated systems. Thereby, a common solution is the redundant implementation of components. However, redundancy collides with another major issue of integrated circuits - power dissipation. The main contribution of this work is an approach that increases the lifetime reliability at only low delay and power penalty. Therefore, the well-known standby-leakage reduction technique “Sleep Transistors” is combined with the idea of redundancy. Additional, we propose an extended flow for reliability verification on transistor level. Simulation results indicate that the new approach can increase the lifetime reliability by more than factor 2 compared to initial designs.