Accuracy of residual phase noise characterization of active RF/microwave devices

Phase noise is widely recognized as a crucial parameter in many classes of microwave communication systems. Phase noise can deteriorate the signal-to-noise ratio and can cause severe problems in data fidelity in receiving systems. A precise measurement of phase noise characteristics is significant in the development of system architecture and component selection. The measurement accuracy of phase noise tests can be seriously corrupted by the effects of the bias supply of active devices being characterized for spectral density. This paper presents an in-depth analysis of accuracy problems encountered with such bias supply effects and provides a quantitative solution to these problems.