Spin-polarized scanning electron microscopy

In this paper, a review is presented of a powerful technique for studying magnetic microstructures: spin-polarized scanning electron microscopy, denoted as spin-SEM, or SEMPA. When the beam of a scanning electron microscope traverses a ferromagnetic sample, secondary electrons are emitted whose spin polarization contains information on the magnitude and direction of the magnetization of the surface. Various illustrative examples are presented which describe the main features of the technique, such as its very high surface sensitivity, its suitability for achieving complete separation of relevant magnetic and topographic information, and its high lateral resolution.