Design AST with Vendor Electronics - Reprinted from Reliability Growth Through Application of Accelerated Reliability Techniques and Continual Improvement Processes, Proceedings of the IES Annual Technical Meeting, pp. 347354, with permission from the author and the Institute of Environmental Sciences and Technology (IEST) 1991. | part of Accelerated Stress Testing Handbook: Guide for Achieving Quality Products | Wiley-IEEE Press books | IEEE Xplore