DC Transient Monitoring and analysis to prevent EOS in burn-in systems

This paper describes a Direct Current (DC) Transient Monitoring system integrated in burn-in test systems, to detect exceed voltages and occurrences per period limits, and record readings into a database for analysis of noise (physical and behavior). The system has features to automatically shut down a burn-in system to prevent damage to devices under test from electrical overstress (EOS) events.