Fabrication and X-Ray Calibration of Thin Plastic Scintillator Detectors

Thin film plastic scintillator detectors were fabricated and calibrated with x rays in the 1.5-20 keV range. The calibration systems used are described. Measurements showed that the presence of a film substrate can significantly change the detector response. X-ray conversion efficiency was determined as a function of energy and shown to be a strong function of energy for low energy x rays.