Automated Linear System Parameter Identification Using Successive Differentiation and its Application in Microprocessor Controlled C and Tan δ Measurement

A new algorithm is suggested for linear system parameter identification, which lends itself easily to implementation using microprocessors. The main feature of this algorithm is that it is based on the estimation of the values of the successive derivatives of the input and output variables. This new algorithm was successfully used to measure unknown capacitances and inductances together with their loss angles using the TMS9980A microprocessor.